ISO/AWI TS 23879
Nanotechnologies — Structural characterization of graphene oxide flakes: thickness and lateral size measurement using AFM and SEM
Reference number
ISO/AWI TS 23879
Edition 1
Working draft
ISO/AWI TS 23879
A working group has prepared a draft.


This document describes methods for measuring the lateral size and thickness of graphene oxide (GO) flakes using scanning electron microscopy (SEM) and atomic force microscopy (AFM) respectively, including sample pre-treatments, measurement procedures and data analysis. It is applicable to the characterization of graphene oxide in powder and liquid dispersion forms.

General information

  •  : Under development
    : New project registered in TC/SC work programme [20.00]
  •  : 1
  • ISO/TC 229
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