ISO/AWI TS 23879
u
ISO/AWI TS 23879
84861

Abstract 

This document describes methods for measuring the lateral size and thickness of graphene oxide (GO) flakes using scanning electron microscopy (SEM) and atomic force microscopy (AFM) respectively, including sample pre-treatments, measurement procedures and data analysis. It is applicable to the characterization of graphene oxide in powder and liquid dispersion forms.


General information 

  •  :  Under development
  •  : 1
  •  : ISO/TC 229 Nanotechnologies
  •  :

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