This document describes methods for measuring the lateral size and thickness of graphene oxide (GO) flakes using scanning electron microscopy (SEM) and atomic force microscopy (AFM) respectively, including sample pre-treatments, measurement procedures and data analysis. It is applicable to the characterization of graphene oxide in powder and liquid dispersion forms.
Status: Under development
Technical Committee: ISO/TC 229 Nanotechnologies
- ICS :
This standard contributes to the following Sustainable Development Goal:
ISO/AWI TS 23879Stage: 20.00
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