ISO/AWI TS 23879
Nanotechnologies — Structural characterization of graphene oxide flakes: thickness and lateral size measurement using AFM and SEM
Reference number
ISO/AWI TS 23879
Edition 1
Working draft
u
ISO/AWI TS 23879
84861
A working group has prepared a draft.

Abstract

This document describes methods for measuring the lateral size and thickness of graphene oxide (GO) flakes using scanning electron microscopy (SEM) and atomic force microscopy (AFM) respectively, including sample pre-treatments, measurement procedures and data analysis. It is applicable to the characterization of graphene oxide in powder and liquid dispersion forms.

General information

  •  : Under development
    : New project registered in TC/SC work programme [20.00]
  •  : 1
  • ISO/TC 229
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