Tema de trabajo aprobado
ISO/AWI TS 23879
Nanotechnologies — Structural characterization of graphene oxide flakes: thickness and lateral size measurement using AFM and SEM
Reference number
ISO/AWI TS 23879
ISO/AWI TS 23879
Edition 1
© ISO 2024
Tema de trabajo aprobado
Resumen
This document describes methods for measuring the lateral size and thickness of graphene oxide (GO) flakes using scanning electron microscopy (SEM) and atomic force microscopy (AFM) respectively, including sample pre-treatments, measurement procedures and data analysis. It is applicable to the characterization of graphene oxide in powder and liquid dispersion forms.
Informaciones generales
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Estado: En desarrolloEtapa: Nuevo proyecto registrado en el programa de trabajo TC/SC [20.00]
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Edición: 1
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Comité Técnico :ISO/TC 229
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