ISO 24173:2009
Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
Reference number
ISO 24173:2009
Edition 1
2009-09
© ISO 2024
Withdrawn
Withdrawn (Edition 1, 2009)

Abstract

ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

General information

  • Status
     : Withdrawn
    Publication date
     : 2009-09
    Stage
    : Withdrawal of International Standard [95.99]
  • Edition
     : 1
    Number of pages
     : 43
  • Technical Committee :
    ISO/TC 202
    ICS :
    71.040.50 
  • RSS updates

Life cycle

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This standard contributes to the following Sustainable Development Goal

9
Industry, Innovation and Infrastructure

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