ISO 24173:2024
p
ISO 24173:2024
82749

Status : Published

en
Format Language
std 1 173 PDF + ePub
std 2 173 Paper
  • CHF173
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Abstract

This document gives guidance on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

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General information

  •  : Published
     : 2024-02
    : International Standard published [60.60]
  •  : 2
     : 40
  • ISO/TC 202
    71.040.50 
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