ISO 19606:2017
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ISO 19606:2017
65457

Status : Published (To be revised)

This standard will be replaced by ISO/DIS 19606
en
Format Language
std 1 129 PDF
std 2 129 Paper
  • CHF129
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Abstract

ISO 19606:2017 describes a method to evaluate the adequateness of a probe tip for fine-ceramic thin-film surface roughness measurements by atomic force microscopy, of surfaces with an arithmetical mean roughness, Ra, in the range of about 1 nm to 30 nm and a mean width of roughness profile elements, RSm, in the range of about 0,04 μm to 2,5 μm.

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General information

  •  : Published
     : 2017-02
    : International Standard to be revised [90.92]
  •  : 1
     : 24
  • ISO/TC 206
    81.060.30 
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