ISO 18452:2005
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ISO 18452:2005
38701

Abstract  Preview

ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.


General information 

  •  :  Published
     : 2005-11
  •  : 1
     : 9
  •  : ISO/TC 206 Fine ceramics
  •  :
    81.060.30 Advanced ceramics

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std 1 58 PDF
std 2 58 Paper
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