ISO 18452:2005
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ISO 18452:2005
38701

Status : Published (Under review)

This standard was last reviewed and confirmed in 2019. Therefore this version remains current.
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Format Language
std 1 63 PDF
std 2 63 Paper
  • CHF63
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Abstract

ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.

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General information

  •  : Published
     : 2005-11
    : International Standard confirmed [90.93]
  •  : 1
     : 9
  • ISO/TC 206
    81.060.30 
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Life cycle

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