ISO 11562:1996
w
ISO 11562:1996
21977

Abstract 

Describes the metrological characteristics of phase correct filters for the measurement of surface profiles. In particular it specifies how to separate the long and short wave content of a surface profile.


General information 

  •  :  Withdrawn
     : 1996-12
  •  : 1
     : 8
  •  : ISO/TC 213 Dimensional and geometrical product specifications and verification
  •  :
    17.040.20 Properties of surfaces

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