Describes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979.
Status: PublishedPublication date: 1996-12
Edition: 2Number of pages: 13
Technical Committee: ISO/TC 213 Dimensional and geometrical product specifications and verification
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