ISO 6342:1993
w
ISO 6342:1993
12641

Status : Withdrawn

This standard has been revised by ISO 6342:2003

Abstract

The method specified determines the buildup thickness of the aperture card as the difference between the thickness of the buildup area and the thickness of the card both measured using a micrometer.

General information

  •  : Withdrawn
     : 1993-08
    : Withdrawal of International Standard [95.99]
  •  : 1
     : 3
  • ISO/TC 171/SC 2
    37.080 
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