Projet final
Norme internationale
ISO/FDIS 21456
Determination of the residual stress of TGO layer in thermal barrier coating by photoexcitation fluorescence piezoelectric spectroscopy
Numéro de référence
ISO/FDIS 21456
Edition 1
Projet final Norme internationale
ISO/FDIS 21456
86757
Projet au stade approbation.

Résumé

This document describes the test method for the determination of the residual stress of the TGO layer in thermal barrier coating by photoexcitation fluorescence piezoelectric spectroscopy. This test method requires that there must be a Cr element in the bond coat of the thermal barrier coating, i.e., Cr element shall exist in the TGO layer. This test method of determining the residual stress in the TGO layer of the thermal barrier coating system is not limited by the preparation method of the thermal barrier coatings. Particularly, the thermal barrier coating system prepared by EB-PVD has a better effect. This method provides guidance on determining reliable estimates of residual stresses from fluorescence spectral data and estimating uncertainties in the results.

Informations générales

  •  : Projet
    : Texte final reçu ou FDIS enregistré pour approbation formelle [50.00]
  •  : 1
  • ISO/TC 107
    25.220.01 
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