Resumen
This document gives guidance on the measurement and use of experimentally-determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy. The methods described only apply to polycrystalline and amorphous materials, as effects inherent to single-crystal samples are not addressed.
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Informaciones generales
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Estado: PublicadoFecha de publicación: 2024-02Etapa: Norma Internacional publicada [60.60]
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Edición: 3Número de páginas: 22
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Comité Técnico :ISO/TC 201/SC 7ICS :71.040.40
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Ciclo de vida
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Anteriormente
RetiradaISO 18118:2015
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Ahora
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