Reference number
ISO 9220:2022
International Standard
ISO 9220:2022
Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
Edition 2
2022-02
Preview
ISO 9220:2022
78212
No disponible en español
Publicado (Edición 2, 2022)

ISO 9220:2022

ISO 9220:2022
78212
Idioma
Formato
CHF 63
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Resumen

This document specifies a destructive method for the measurement of the local thickness of metallic and other inorganic coatings by examination of cross-sections with a scanning electron microscope (SEM). The method is applicable for thicknesses up to several millimetres, but for such thick coatings it is usually more practical to use a light microscope (see ISO 1463). The lower thickness limit depends on the achieved measurement uncertainty (see Clause 10).

NOTE       The method can also be used for organic layers when they are neither damaged by the preparation of the cross-section nor by the electron beam during imaging.

Informaciones generales

  •  : Publicado
     : 2022-02
    : Norma Internacional publicada [60.60]
  •  : 2
     : 12
  • ISO/TC 107
    25.220.40 
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