Resumen
ISO 19840:2012 specifies a procedure for the verification of dry-film thickness against nominal dry-film thickness on rough surfaces, including the adjustment of the instruments used, the definition of inspection areas, sampling plans, measurement methods and acceptance/rejection criteria.
The procedure is based on the use of instruments of the permanent magnet, electromagnet and eddy current type. Instrument accuracy is verified both at zero and at a known thickness on a smooth surface and adjusted if necessary.
It does not apply to nominal dry-film thicknesses less than 40 µm.
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Informaciones generales
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Estado: PublicadoFecha de publicación: 2012-09Etapa: Norma Internacional confirmada [90.93]
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Edición: 2Número de páginas: 16
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Comité Técnico :ISO/TC 35/SC 14ICS :87.020
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Ciclo de vida
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Anteriormente
RetiradaISO 19840:2004
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Ahora
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