ISO 29301:2010
Microbeam analysis — Analytical transmission electron microscopy — Methods for calibrating image magnification by using reference materials having periodic structures
Reference number
ISO 29301:2010
Edición 1
2010-06
Retirada
ISO 29301:2010
45399
Retirada (Edición 1, 2010)

Resumen

ISO 29301:2010 specifies a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM). The reference materials used for calibration possess a periodic structure, such as a diffraction grating replica, a super-lattice structure of semiconductor or an analysing crystal for X-ray analysis, and a crystal lattice image of carbon, gold or silicon. ISO 29301:2010 is applicable to the magnification of the TEM image recorded on a photographic film, or an imaging plate, or detected by an image sensor built into a digital camera. ISO 29301:2010 also refers to the calibration of a scale bar. ISO 29301:2010 does not apply to the dedicated critical dimension measurement TEM (CD-TEM) and the scanning transmission electron microscope (STEM)

Informaciones generales

  •  : Retirada
     : 2010-06
    : Retirada de la Norma Internacional [95.99]
  •  : 1
     : 40
  • ISO/TC 202/SC 3
    37.020 
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