ISO/TR 17055:2002
p
ISO/TR 17055:2002
28510
No disponible en español

Estado : Publicado

es
Formato Idioma
std 1 63 PDF
std 2 63 Papel
  • CHF63
Convertir Franco suizo (CHF) a tu moneda

Resumen

ISO/TR 17055 specifies a method for the determination of the content of silicon in steel by means of inductively coupled plasma emission spectrometry. The method is applicable to silicon contents of mass fraction 0,02 % to 5 %.

The method uses a calibration based on a very close matrix matching of the calibration solutions to the sample and close bracketing of the contents around the approximate concentration of silicon in the sample to be analysed. The concentrations of all elements in the sample has, therefore, to be approximately known. If the concentrations are not known the sample has to be analysed by some semi quantitative method.

Preview 

Previsualice esta norma en nuestra Plataforma de navegación en línea (OBP)

Informaciones generales

  •  : Publicado
     : 2002-04
    : Norma Internacional publicada [60.60]
  •  : 1
     : 9
  • ISO/TC 17/SC 1
    77.080.20 
  • RSS actualizaciones

Got a question?

Check out our FAQs

Customer care
+41 22 749 08 88

Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)