ISO/AWI TS 21356-2
u
ISO/AWI TS 21356-2
83449

Abstract 

This document details the methods for characterising the structural properties of CVD-grown graphene. The methods used are optical microscopy, Raman spectroscopy and transmission electron microscopy (TEM). The properties determined are the percentage of substrate coverage of graphene, number of layers, the level of disorder and layer stacking. Sample preparation routines, measurement protocols and data analysis for the characterisation of CVD-grown graphene are provided.


General information 

  •  :  Under development
  •  : 1
  •  : ISO/TC 229 Nanotechnologies
  •  :

Got a question?

Check out our FAQs

Customer care
+41 22 749 08 88

Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)

Keep up to date with ISO

Sign up to our newsletter for the latest news, views and product information.