ISO/TS 10867:2019
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ISO/TS 10867:2019
75336

Status : Published (Under review)

This standard was last reviewed and confirmed in 2023. Therefore this version remains current.
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Format Language
std 1 96 PDF + ePub
std 2 96 Paper
  • CHF96
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Abstract

This document gives guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy.

It provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNTs in a sample and their relative integrated PL intensities.

The method can be expanded to estimate the relative mass concentrations of semi-conducting SWCNTs in a sample from their measured integrated PL intensities and knowledge of their PL cross-sections.

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General information

  •  : Published
     : 2019-12
    : International Standard confirmed [90.93]
  •  : 2
     : 17
  • ISO/TC 229
    07.120 
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