Résumé
This document specifies methods for characterizing and calibrating the scan axes of scanning-probe microscopes (SPMs) for measuring geometric quantities at the highest level. It is applicable to those providing further calibrations and is not intended for general industry use, where a lower level of calibration might be required.
This document has the following objectives:
— to increase the comparability of measurements of geometrical quantities made using SPMs by traceability to the unit of length;
— to define the minimum requirements for the calibration process and the conditions of acceptance;
— to ascertain the instrument's ability to be calibrated (assignment of a "calibrate-ability" category to the instrument);
— to define the scope of the calibration (conditions of measurement and environments, ranges of measurement, temporal stability, transferability);
— to provide a model, in accordance with ISO/IEC Guide 98-3, to calculate the uncertainty for simple geometrical quantities in measurements using an SPM;
— to define the requirements for reporting results.
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Informations générales
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État actuel: PubliéeDate de publication: 2019-05Stade: Norme internationale en cours d'examen systématique [90.20]
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Edition: 2
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Comité technique :ISO/TC 201/SC 9ICS :71.040.40
- RSS mises à jour
Cycle de vie
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Précédemment
AnnuléeISO 11952:2014
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Actuellement
PubliéeISO 11952:2019
Les normes ISO sont réexaminées tous les cinq ans
Stade: 90.20 (En cours d'examen)
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